Hitachi SU3800/SU3900 VP-SEM

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Hitachi SU3800 / SU3900
VP-SEM

Variable Pressure Scanning Electron Microscope

HIGHLIGHTS
Hitachi SU3800 / SU3900 VP-SEM

Automatic optical axis adjustment
Intelligent Filament Technology
Continuous beam brightness controls
Ultra Variable-pressure Detector (UVD) for Topo, CL and STEM
Photodiode Backscattered Electron Detector (PD-BSD)
Safe specimen exchange sequence
SEM MAP for seamless navigation of the entire observable area
Wide Area Camera Navigation System
SEM/EDS integration & automated Morpho-Chemical system

Low Voltage Analysis in VP

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SU3800/3900 VP-SEM

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(SICM)

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