Sub-nm SCHOTTKY FE-SEM

☰

×

Hitachi SU8700
Sub-nm SCHOTTKY FE-SEM

Redefining sub-nm Schottky FE-SEM Pinnacle

HIGHLIGHTS
Sub-nm SCHOTTKY FE-SEM

Schottky Field Emission Source
Integrated beam booster column
Compound objective lens flexibilities
Symmetrical in-column signal detections for all modes
Class-leading analytical geometry
Ultralow voltage Beam Deceleration (+/-) Technology
Low voltage BSE imaging for array tomography & HD capturing
Ultra Variable pressure Detector (UVD) for Topo, CL and STEM
Photodiode Backscattered Electron Detector (PD-BSD)

Superb in-column signal detection for all modes

MORE PRODUCTS

SU8700 sub-nm FE-SEM

SU8600 Cold FE-SEM

NX5000 FIB-SEM-Ar

HF5000 200kV TEM/SEM

HT7800 120kV TEM

Soleil Confocal Raman

TM4000II Plus TT-SEM

SU3800/3900 VP-SEM

µCT 45/50/100 Micro-CT

IM4000II / ArBlade5000 Ion milling

Scanning Ion Conductance Microscopy
(SICM)

RMC Ultramicrotomes