Hitachi ArBlade5000 Hybrid Ion Milling System

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Hitachi ARBLADE5000
HYBRID ION MILLING SYSTEM

Hybrid Ion Milling System

HIGHLIGHTS
Hitachi ARBLADE5000 HYBRID ION MILLING SYSTEM

Multi-purpose sample preparation - Hybrid type (Cross-section / Flat milling)
High Throughput Cross-section Milling - 1 mm/hr or higher
Wide Area Cross-Section Milling - Maximum milling width of 8 mm
Timer Function, Second Milling Function & Intermittent Beam Irradiation Function
Cryogenic cross-section ion milling & Air protection sample holder
SEM linkage available
Advance Control Software (ACS)

MORE PRODUCTS

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SU8600 Cold FE-SEM

NX5000 FIB-SEM-Ar

HF5000 200kV TEM/SEM

HT7800 120kV TEM

Soleil Confocal Raman

TM4000II Plus TT-SEM

SU3800/3900 VP-SEM

µCT 45/50/100 Micro-CT

IM4000II / ArBlade5000 Ion milling

Scanning Ion Conductance Microscopy
(SICM)

RMC Ultramicrotomes