FIB-SEM-Ar

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NX5000
FIB-SEM-Ar

The Ultimate FIB-SEM-Ar Geometry

HIGHLIGHTS
FIB-SEM-Ar

All possible FIB geometries: Vertical, Tilted and Orthogonal
High brightness Cold FE-SEM in double- and triple beam systems
Ultimate 3D Reconstruction and Analysis in nm precision by Orthogonal layout
Anti Curtain Effect (ACE) technology for high definition lamella preparation

Micro-Sampling® with orientation control
High resolution real-time SEM imaging during Ga-FIB or Ar/Xe milling
Low damage control with triple beam optics (low energy Ar/Xe)
Seven axis movement freedoms: XYZRT plus Slant and Flip

Fully automated TEM lamella preparation from lift-out to final finishing

3D structural analysis at nanometer scale

MORE PRODUCTS

SU8700 sub-nm FE-SEM

SU8600 Cold FE-SEM

NX5000 FIB-SEM-Ar

HF5000 200kV TEM/SEM

HT7800 120kV TEM

Soleil Confocal Raman

TM4000II Plus TT-SEM

SU3800/3900 VP-SEM

µCT 45/50/100 Micro-CT

IM4000II / ArBlade5000 Ion milling

Scanning Ion Conductance Microscopy
(SICM)

RMC Ultramicrotomes