COLD FE-SEM

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Hitachi SU8600
UHR COLD FE-SEM

Exclusive Cold FE-SEM Dominance Unleased

HIGHLIGHTS
UHR COLD FE-SEM

Exclusive Cold Field Emission Source merits
Exclusive ExB energy filtering
Exclusive Super ExB signal mixing
Exclusive Semi-in-lens Objective Optics
Beam Deceleration Technology
Pure signal detections for absolute surface information
Single molecular layer sensitivity
Sub-10nm EDS mapping with Windowless SDD
Surface (SEM) to Bulk (STEM) correlative microscopy

Sample Analysis Imaging

MORE PRODUCTS

SU8700 sub-nm FE-SEM

SU8600 Cold FE-SEM

NX5000 FIB-SEM-Ar

HF5000 200kV TEM/SEM

HT7800 120kV TEM

Soleil Confocal Raman

TM4000II Plus TT-SEM

SU3800/3900 VP-SEM

µCT 45/50/100 Micro-CT

IM4000II / ArBlade5000 Ion milling

Scanning Ion Conductance Microscopy
(SICM)

RMC Ultramicrotomes