200kV ABERRATION-CORRECTED TEM/STEM /SEM

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Hitachi HF5000
ABERRATION-CORRECTED 200kV SEM/STEM/TEM

Correlative Surface (SEM) to Bulk (STEM) observation with atomic resolution

HIGHLIGHTS
ABERRATION-CORRECTED 200kV SEM/STEM/TEM

Fully automated probe-forming spherical aberration corrector
High-brightness and high-stability cold FE electron gun
Ultra-stable column & power supplies
Simultaneous Cs-corrected atomic resolution SEM & STEM imaging capability
New high-stability side-entry specimen stage & specimen holders
Symmetrically opposed dual 100mm2 EDS detectors: “Dual SDD”
Newly designed enclosure for optimum performance
A wide range of Hitachi advanced specimen holders

The Perfect Harmony of Imaging Resolution & Analytical

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