Used for precise and quantitative 3-dimensional elemental mapping of chemical heterogeneities in materials at the atomic  scale.Its lateral and depth resolution are the highest of any elemental analysis instrument. The Advanced LASER Assisted mode permits the Analysis of semiconductors and low conductivity materials. Developed in collaboration with the University of Rouen – France, world leading group in the fiels, CAMECA’s LA-WATAP combines the ultimate performance of a research tool (femto-second LASER, Advanced Delay Line Detector – ADLD) with high throughput ans flexibility (data rate, FIM, large storage chamber, etc.) for industry applications.

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