• Advanced Microscopy
    • 3D True Color Optical Imaging
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    • Acoustic Microscopy
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    • Confocal Laser Scanning Microscopy
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    • Electron Microscopy       
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    • Infrared Microscopy

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    • Live Cell Imaging

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    • Industrial Optical Microscopy

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    • Scanning Probe Microscopy

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  • Focused Ion Beam (FIB)
    • Single Beam System
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    • Double Beam System

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    • Triple Beam System

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    • Cross Beam System

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    • Neon

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  • Microanalysis
    • Electron Probe Micro-Analyzer (EPMA)

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    • Energy Dispersive Microanalysis System (EDS)

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    • Wavelength Dispersive Microanalysis System (WDS)

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    • Electron Backscattered Diffraction (EBSD)

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  • Surface Metrology
    • 3D True Colour Optical Profiler

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    • Stylus Profiler

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    • Non-contact optical Profiler

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  • Semiconductor Metrology
    • Industrial Optical Microscopy

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    • Infared Microscopy

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    • Defect Inspection, Review and ADC

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    • Macro and Micro Defect Review Tool

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  • Surface Sciences
    • Sector SIMS

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    • Time OF Flight SIMS

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    • Quadrapole SIMS

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    • LEIS

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    • LEXES

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    • Tomographic Atom Probe

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  • UHV Thin Film Deposition
    • Physical Vapor Deposition (PVD)

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    • Molecular Beam Epitaxy System (MBE)

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  • Vacuum Solution
  • Workstations
    • Imaging Workstation

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    • Fluorescence Workstation

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    • Live Cell Imaging Workstation

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    • Material Workstation

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  • Sample Preparations
    • Drying

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    • Coating

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    • Cryo transfer

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    • Cryo-fixation

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    • Freeze-etch & -fracture System

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    • Freeze Substitution System

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    • Glass Knife Maker & Diamond Knives

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    • Ultramicrotome

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    • Ultramicrotome With Cryo

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    • Microtome

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    • Automatic Tissue Processor

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    • Argon Ion Milling System

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Surface Sciences

Contact & Support
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Time of Flight SIMS
The flexible, high precision sample manipulators as well as the perfect charge compensation allow the analysis of virtually all kinds of samples ……..

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Sector SIMS
IMS 7F / 7f-GEO, IMS WF, SC Ultra, IMS 1280 and Shielded IMS 7FR
read more...

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Quadrupole SIMS
UNIVERSAL QUADRUPOLE SIMS 4550 and FULL-WAFER METROLOGY TOOL for ULE SIMS 4600
read more...

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LEIS
The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer …..

read more...
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LEXES
Used in the semiconductor industry for yield enhancement during R&D, Technology Ramping and Mass Production phases. Provides non-destructive ……

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Tomographic Atom Probe
Used for precise and quantitative 3-dimensional elemental mapping of chemical heterogeneities in materials at the atomic scale.Its lateral and depth resolution are the highest of any elemental analysis ….

 

 
     
   

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