Scanning Probe Microscope
SPM is a generic name to a family of
probe microscopy techique where a fine probe mounted on
a piezoelectric
x, y and z
scanner (called the cantilever), makes a scan over a
surface which can reveal images down to atomic level.
The SPM is based ona principle that uses
a laser beam reflection known as Isotopic Focal System
to monitor the cantilever deflection caused by different
physical properties of the sample.
This principle permits registration of
both the normal deflection of the cantilever with sub
angstrom resolution and its twisting angle, so that
normal and lateral forces can be measured
simultaneously.
The types of measured interaction can be
classified into techniques below:-
-
Atomic Force Microscopy (AFM)
-
Scanning Tunneling Microscopy (STM)
-
Lateral Force Microscopy (LFM)
-
Magnetic Force Microscopy (MFM)
-
Electric Force Microscopy (EFM)
-
Scanning Capacitance Microscopy (SCM)
