*** Surface Metrology ***

Advanced Microscopy
- 3D True Color Optical Imaging
- Acoustic Microscopy
- Confocal Laser Scanning Microscopy
- Electron Microscopy
- Infrared Microscopy
- Live Cell Imaging
- Industrial Optical Microscopy
- Scanning Probe Microscopy
Focused Ion Beam (FIB)
- Single Beam System
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- Double Beam System
- Triple Beam System
- Cross Beam System
- Neon
Microanalysis
- Electron Probe Micro-Analyzer (EPMA)
- Energy Dispersive Microanalysis System (EDS)
- Wavelength Dispersive Microanalysis System (WDS)
- Electron Backscattered Diffraction (EBSD)
Surface Metrology
- 3D True Colour Optical Profiler
- Stylus Profiler
- Scanning Probe Microscope
- Interferometer
- Optical Profiler
- Mechanical Testers Base
- Tribometers
Semiconductor Metrology
- Industrial Optical Microscopy
- Infared Microscopy
- Defect Inspection, Review and ADC
- Macro and Micro Defect Review Tool
Surface Sciences
- Sector SIMS
- Time OF Flight SIMS
- Quadrapole SIMS
- LEIS
- LEXES
- Tomographic Atom Probe
UHV Thin Film Deposition
- Physical Vapor Deposition (PVD)
- Molecular Beam Epitaxy System (MBE)
Vacuum Solution
Imaging Workstations
- Imaging Analyzer
- Fluorescence Workstation
- Live Cell Imaging Workstation
- Material Workstation
Sample Preparations
- Drying
- Coating
- Cryo transfer
- Cryo-fixation
- Freeze-etch & -fracture System
- Freeze Substitution System
- Glass Knife Maker & Diamond Knives
- Ultramicrotome
- Ultramicrotome With Cryo
- Microtome
- Automatic Tissue Processor
- Argon Ion Milling System

Surface Metrology
Mechanical Testers Base

Contact & Support
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BASE INTRO

High precision Indentation|Hardness, Scratch|Adhesion and Wear|FrictionTesters for determining properties of thin/thick coatings and substrates. The tool covers from Nano, Micro and Macro applications such as measuring hardness and elastic modulus of particles in pharmacology to high loads required to test the fracture toughness of hard coatings in the tooling industry. Nanovea Mechanical Testers use independent force & depth sensors to obtain depth versus load curves used in instrumented indentation. Force feedback control loop allows stable high precision scratch/adhesion and wear/friction testing.
Both the Platform and Compact Bases can retrofit a Nano Module up to 400mN, a Micro Module up to 40N and a Macro Module with load up to 200N to cover the widest range in the industry. A Optical Pen and an Atomic Force Microscope are available for high resolution imaging of indents, scratches and wear tracks in addition to allowing other profiling work such as roughness measurements.

*For specifications please refer to brochure download.

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- PLATFORM BASE

- COMPACT BASE

- ERGONOMIC WORKSTATION

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