• Advanced Microscopy
    • 3D True Color Optical Imaging
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    • Acoustic Microscopy
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    • Confocal Laser Scanning Microscopy
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    • Electron Microscopy       
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    • Infrared Microscopy

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    • Live Cell Imaging

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    • Industrial Optical Microscopy

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    • Scanning Probe Microscopy

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  • Focused Ion Beam (FIB)
    • Single Beam System
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    • Double Beam System

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    • Triple Beam System

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    • Cross Beam System

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    • Neon

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  • Microanalysis
    • Electron Probe Micro-Analyzer (EPMA)

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    • Energy Dispersive Microanalysis System (EDS)

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    • Wavelength Dispersive Microanalysis System (WDS)

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    • Electron Backscattered Diffraction (EBSD)

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  • Surface Metrology
    • 3D True Colour Optical Profiler

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    • Stylus Profiler

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    • Non-contact optical Profiler

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  • Semiconductor Metrology
    • Industrial Optical Microscopy

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    • Infared Microscopy

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    • Defect Inspection, Review and ADC

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    • Macro and Micro Defect Review Tool

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  • Surface Sciences
    • Sector SIMS

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    • Time OF Flight SIMS

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    • Quadrapole SIMS

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    • LEIS

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    • LEXES

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    • Tomographic Atom Probe

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  • UHV Thin Film Deposition
    • Physical Vapor Deposition (PVD)

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    • Molecular Beam Epitaxy System (MBE)

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  • Vacuum Solution
  • Workstations
    • Imaging Workstation

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    • Fluorescence Workstation

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    • Live Cell Imaging Workstation

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    • Material Workstation

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  • Sample Preparations
    • Drying

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    • Coating

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    • Cryo transfer

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    • Cryo-fixation

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    • Freeze-etch & -fracture System

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    • Freeze Substitution System

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    • Glass Knife Maker & Diamond Knives

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    • Ultramicrotome

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    • Ultramicrotome With Cryo

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    • Microtome

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    • Automatic Tissue Processor

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    • Argon Ion Milling System

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Surface Metrology

Contact & Support
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3D True Colour Optical Profiler

InfiniteFocus is an optical 3D measurement device for quality assurance in the micro- and nano range. It provides all functionalities for dimensional measurements, surface analysis and characterization. Geometries with steep flanks, highly reflective properties and strong roughness are measured with a vertical resolution up to 10nm, making the instrument ideal for surface study of both homogeneous and compound materials. 3D Measurements are performed directly in the optical image.

Its operating principle combines the small depth of focus of an optical system with vertical scanning to provide topographical and colour information from the variation of focus.

Novel and unique algorithms reconstruct this into a single 3D data set with accurate topographical information. Traceable calibration standards allow the verification of measurement results. The instrument can be used in both the laboratory and during production, it can also be operated by semi skilled technicians where required. Automation of functions and analysis can also be added to make the instrument useable for the majority of surface metrology and inspection requirements.

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 Features  
  • Measurement of steep flanks and topography of inhomogeneous surfaces with varying reflectivity with accuracy of 10nm vertical resolution

  • 3D data with registered true Colour information

  • Non-destructive roughness measurement and evaluation of smoothness

  • Measurement capabilities such as profile, area, form, volume and 2D image analysis with conformity to ISO standards.

  • InfiniteFocusŪ Inline

     

 

     
   

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