Semiconductor Metrology
Marco and Micro Defect Review Tool
Contact & Support
_____________________________________________

Vistec LDS3200
Combining high-speed
macro defect detection with
high-resolution optical inspection
and review. The LDS3200 for
automated m ...

Vistec LDS33000
Peak Performance in
Automatic Defect Detection for 300mm
Wafers The brand new automated defect
detection and classification ...
read more...
