*** Microanalysis ***

Advanced Microscopy
- 3D True Color Optical Imaging
- Acoustic Microscopy
- Confocal Laser Scanning Microscopy
- Electron Microscopy
- Infrared Microscopy
- Live Cell Imaging
- Industrial Optical Microscopy
- Scanning Probe Microscopy
Focused Ion Beam (FIB)
- Single Beam System
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- Double Beam System
- Triple Beam System
- Cross Beam System
- Neon
Microanalysis
- Electron Probe Micro-Analyzer (EPMA)
- Energy Dispersive Microanalysis System (EDS)
- Wavelength Dispersive Microanalysis System (WDS)
- Electron Backscattered Diffraction (EBSD)
Surface Metrology
- 3D True Colour Optical Profiler
- Stylus Profiler
- Non-contact optical Profiler
Semiconductor Metrology
- Industrial Optical Microscopy
- Infared Microscopy
- Defect Inspection, Review and ADC
- Macro and Micro Defect Review Tool
Surface Sciences
- Sector SIMS
- Time OF Flight SIMS
- Quadrapole SIMS
- LEIS
- LEXES
- Tomographic Atom Probe
UHV Thin Film Deposition
- Physical Vapor Deposition (PVD)
- Molecular Beam Epitaxy System (MBE)
Vacuum Solution
Workstations
- Imaging Workstation
- Fluorescence Workstation
- Live Cell Imaging Workstation
- Material Workstation
Sample Preparations
- Drying
- Coating
- Cryo transfer
- Cryo-fixation
- Freeze-etch & -fracture System
- Freeze Substitution System
- Glass Knife Maker & Diamond Knives
- Ultramicrotome
- Ultramicrotome With Cryo
- Microtome
- Automatic Tissue Processor
- Argon Ion Milling System

Microanalysis
Electron Probe Micro-Analyzer (EPMA)

Contact & Support
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Electron Probe Micro-Analyzer

Reference EPMA

Used in material science and geological applications. Provides precise, qualitative and quantitative measurement and mapping of elemental sample composition, at sub-micron to micron lateral resolution. The SX 100 is a fully digital instrument with highly integrated electronics and is fully automated for unattended analysis and evaluation. Operators find the instrument easy t use due to a dedicated keyboard control panel and a PC/Microsoft� Windows� - based software user interface. The precision ands reliability of the CAMECA WDS analyzers, along with the extreme stability of the primary beam, ensure long term, high precision measurements. The SX100R, shielded version, is available for radioactive sample analysis. The Ultra-Chron version is optimized for geochronology.

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- SX100

- SX100R

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