NEON® Series
The novel Zeiss NEON® series allows a flexible
combination of the Gemini® technology with the full CrossBeam®
functionality to yield an extremely powerful 3D analysis
workstation.
With its unique upgrade path concept the NEON® allows
to extend the proven analysis and imaging capabilities of the
ultra-high resolution, low dose Gemini® Field Emission Scanning
Electron Microscope (FESEM) to the third dimension.
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NEON® is now available in three different
platform configurations
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NEON® 40 / NEON® 40EsB for small to medium sized
samples and general purpose applications
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NEON® 60 Large chamber with 6“ stage and
integrated 8“ airlock
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