• Advanced Microscopy
    • 3D True Color Optical Imaging
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    • Acoustic Microscopy
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    • Confocal Laser Scanning Microscopy
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    • Electron Microscopy       
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    • Infrared Microscopy

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    • Live Cell Imaging

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    • Industrial Optical Microscopy

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    • Scanning Probe Microscopy

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  • Focused Ion Beam (FIB)
    • Single Beam System
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    • Double Beam System

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    • Triple Beam System

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    • Cross Beam System

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    • Neon

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  • Microanalysis
    • Electron Probe Micro-Analyzer (EPMA)

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    • Energy Dispersive Microanalysis System (EDS)

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    • Wavelength Dispersive Microanalysis System (WDS)

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    • Electron Backscattered Diffraction (EBSD)

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  • Surface Metrology
    • 3D True Colour Optical Profiler

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    • Stylus Profiler

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    • Non-contact optical Profiler

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  • Semiconductor Metrology
    • Industrial Optical Microscopy

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    • Infared Microscopy

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    • Defect Inspection, Review and ADC

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    • Macro and Micro Defect Review Tool

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  • Surface Sciences
    • Sector SIMS

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    • Time OF Flight SIMS

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    • Quadrapole SIMS

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    • LEIS

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    • LEXES

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    • Tomographic Atom Probe

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  • UHV Thin Film Deposition
    • Physical Vapor Deposition (PVD)

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    • Molecular Beam Epitaxy System (MBE)

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  • Vacuum Solution
  • Workstations
    • Imaging Workstation

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    • Fluorescence Workstation

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    • Live Cell Imaging Workstation

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    • Material Workstation

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  • Sample Preparations
    • Drying

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    • Coating

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    • Cryo transfer

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    • Cryo-fixation

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    • Freeze-etch & -fracture System

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    • Freeze Substitution System

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    • Glass Knife Maker & Diamond Knives

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    • Ultramicrotome

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    • Ultramicrotome With Cryo

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    • Microtome

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    • Automatic Tissue Processor

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    • Argon Ion Milling System

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Advanced Microscopy
 

Contact & Support
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3D True Colour Optical Profiler
InfiniteFocus is an optical 3D measurement device for quality assurance in the micro- and nano range. It provides all functionalities for dimensional measurements, surface analy…….
read more...

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Acoustic Microscopy
 Bat find its way around by emitting short ultrasonic pulses and it detects reflected echoes from obstacles along.....
 read more...

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Confocal Laser Scanning Microscopy
Multi Products - One Goal: Superior Image Performance
The Leica TCS STED is the first commercially available light microscope which enables the investigation of structural details below the 100 nm resolution range. Its super resolution capacity allows confocal imaging with a resolution ...

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Electron Microscopy
SEM,VP SEM, EPSEM, FESEM, TEM and EFTEM
read more...

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Infrared Microscopy
Vistec INM 100 IR and Vistec IRIS2000
read more...

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Live Cell Imaging
Leica AF6000LX, Leica SD6000 - Spinning Disk Confocal and Leica AF6000 Fluorescence Imaging
read more...

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Industrial Optical Microscopy
 Vistec INM 300DUV/UV, Vistec INM 200UV and Vistec INM 100
read more...

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Scanning Probe Microscope
SPM is a generic name to a family of probe microscopy techique where a fine probe mounted on a piezoelectric  x, y and z scanner ………
read more...

 

 
     
   

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