• Advanced Microscopy
    • 3D True Color Optical Imaging
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    • Acoustic Microscopy
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    • Confocal Laser Scanning Microscopy
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    • Electron Microscopy       
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    • Infrared Microscopy

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    • Live Cell Imaging

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    • Industrial Optical Microscopy

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    • Scanning Probe Microscopy

    • -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
  • Focused Ion Beam (FIB)
    • Single Beam System
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    • Double Beam System

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    • Triple Beam System

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    • Cross Beam System

    • ---------------------------------------------------------------------------------------------------------------------------------
    • Neon

    • ---------------------------------------------------------------------------------------------------------------------------------
  • Microanalysis
    • Electron Probe Micro-Analyzer (EPMA)

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    • Energy Dispersive Microanalysis System (EDS)

    • -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
    • Wavelength Dispersive Microanalysis System (WDS)

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    • Electron Backscattered Diffraction (EBSD)

    • -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
  • Surface Metrology
    • 3D True Colour Optical Profiler

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    • Stylus Profiler

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    • Non-contact optical Profiler

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  • Semiconductor Metrology
    • Industrial Optical Microscopy

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    • Infared Microscopy

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    • Defect Inspection, Review and ADC

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    • Macro and Micro Defect Review Tool

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  • Surface Sciences
    • Sector SIMS

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    • Time OF Flight SIMS

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    • Quadrapole SIMS

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    • LEIS

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    • LEXES

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    • Tomographic Atom Probe

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  • UHV Thin Film Deposition
    • Physical Vapor Deposition (PVD)

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    • Molecular Beam Epitaxy System (MBE)

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  • Vacuum Solution
  • Workstations
    • Imaging Workstation

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    • Fluorescence Workstation

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    • Live Cell Imaging Workstation

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    • Material Workstation

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  • Sample Preparations
    • Drying

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    • Coating

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    • Cryo transfer

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    • Cryo-fixation

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    • Freeze-etch & -fracture System

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    • Freeze Substitution System

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    • Glass Knife Maker & Diamond Knives

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    • Ultramicrotome

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    • Ultramicrotome With Cryo

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    • Microtome

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    • Automatic Tissue Processor

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    • Argon Ion Milling System

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Advanced Microscopy
Electron Microscopy

Contact & Support
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SEM (EVO LS and MA)
The EVO® series SEM has evolved to provide users in Materials Analysis and Life Science with microscopes designed to match their needs. Both microscopes series share some key features…….

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FESEM with VP (Supra Series)
The answer to modern nano science challenges is the unique GEMINI® field emission SEM column, a sophisticated solution recognized by microscopists worldwide ……..

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FESEM with on-axis detectors (Ultra Series)

The ULTRA series, based on the SUPRA™ SEM series comprises a high efficiency, high resolution In-column EsB detector which enables ultra high resolution ……..
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100kV TEM
Since several decades hospitals, universities, bio-medical labs and science centres rely on Carl Zeiss transmission electron microscopes in order to make our life safer…….
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Libra EFTEM series
The all new LIBRA® range of Energy Filtering Transmission Electron Microscopes (EFTEM) combine state of the art electron optics with unique Koehler illumination, OMEGA In-column energy filtering…..

 

     
   

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