• Advanced Microscopy
    • 3D True Color Optical Imaging
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    • Acoustic Microscopy
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    • Confocal Laser Scanning Microscopy
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    • Electron Microscopy       
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    • Infrared Microscopy

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    • Live Cell Imaging

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    • Industrial Optical Microscopy

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    • Scanning Probe Microscopy

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  • Focused Ion Beam (FIB)
    • Single Beam System
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    • Double Beam System

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    • Triple Beam System

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    • Cross Beam System

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    • Neon

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  • Microanalysis
    • Electron Probe Micro-Analyzer (EPMA)

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    • Energy Dispersive Microanalysis System (EDS)

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    • Wavelength Dispersive Microanalysis System (WDS)

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    • Electron Backscattered Diffraction (EBSD)

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  • Surface Metrology
    • 3D True Colour Optical Profiler

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    • Stylus Profiler

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    • Non-contact optical Profiler

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  • Semiconductor Metrology
    • Industrial Optical Microscopy

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    • Infared Microscopy

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    • Defect Inspection, Review and ADC

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    • Macro and Micro Defect Review Tool

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  • Surface Sciences
    • Sector SIMS

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    • Time OF Flight SIMS

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    • Quadrapole SIMS

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    • LEIS

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    • LEXES

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    • Tomographic Atom Probe

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  • UHV Thin Film Deposition
    • Physical Vapor Deposition (PVD)

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    • Molecular Beam Epitaxy System (MBE)

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  • Vacuum Solution
  • Workstations
    • Imaging Workstation

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    • Fluorescence Workstation

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    • Live Cell Imaging Workstation

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    • Material Workstation

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  • Sample Preparations
    • Drying

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    • Coating

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    • Cryo transfer

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    • Cryo-fixation

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    • Freeze-etch & -fracture System

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    • Freeze Substitution System

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    • Glass Knife Maker & Diamond Knives

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    • Ultramicrotome

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    • Ultramicrotome With Cryo

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    • Microtome

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    • Automatic Tissue Processor

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    • Argon Ion Milling System

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Advanced Microscopy
Acoustic Microscopy

Contact & Support
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EVOLUTION PII

The EVOLUTION PII is a unique high-performance tool enabling non destructive acoustic investigations for dedicated high throughput analysis, quality control and research applications requiring the highest resolution capability. This microscope features a new rf transducer technology and a high speed air support linear scanner system to provide up to 60 scan lines per second for optimum imaging and sample throughput. The EVOLUTION PII combines an user-friendly graphical interface and unique image performance for high resolution acoustic imaging and analysis in industrial process control, and research applications. Acoustic objective lenses up to 2000 MHz are available for the PII.

The combination of the integrated light microscope and acoustic microscope modules ensures that the EVOLUTION PII opens new dimensions of non destructive investigation.

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- EVOLUTION I

- EVOLUTION II

- EVOLUTION III

- EVOLUTION PI

- Acoustic Tomograph SAT I

- EVOLUTION II Wafer Automation

- EVOLUTION Twin Scan

 

 

     
   

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