Advanced Microscopy
Acoustic Microscopy
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EVOLUTION II TWIN SCAN
EVOLUTION TWIN SCAN is a high-performance tool enabling non destructive acoustic investigations for high throughput analysis, quality control and research applications. It features a new high speed linear motion scanner and new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface.
A new master/slave concept enables arrays of two or more transducers to acquire simultaneous acoustic images.
Built to semiconductor industry standards around a core platform that utilizes the latest production and research technology, the EVOLUTION TWIN SCAN can accurately handle wafers up to 300 mm and samples up to 320 mm x 200 mm x 45 mm (w/l/h). Ultrasound frequency range up to 500 MHz with transducer from 3 MHz - 400 MHz.
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- EVOLUTION I
- EVOLUTION II
- EVOLUTION III
- EVOLUTION PI
- ECOLUTION PII
- Acoustic Tomograph SAT I
- EVOLUTION II Wafer Automation
