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    • Advanced Microscopy
      • Electron Microscopy
        • TableTop Microscope
          • Tabletop Microscopes TM4000II/TM4000PlusII
          • Tabletop Microscopes TM4000/TM4000Plus
          • TM Series Energy Dispersive X-ray Spectrometer: Quantax75
          • TM Series Energy Dispersive X-ray Spectrometer: Element Series
          • TM Series Energy Dispersive X-Ray Spectrometers: AZtec Series
          • The TM Series 3D visualization software Hitachi map 3D
        • Variable Pressure Scanning Electron Microscope (VP-SEM)
          • Scanning Electron Microscopes SU3800/SU3900
          • Scanning Electron Microscope SU3500
          • Scanning Electron Microscope S-3700N
          • Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
        • Field Emission Scanning Electron Microscope (FESEM)
          • Ultra-high Resolution Field Emission Scanning Electron Microscope SU9000
          • Ultra-high Resolution Field Emission Scanning Electron Microscope Rugulus Series
          • Ultra-High-Resolution Schottky Field Emission Scanning Electron Microscope SU7000
          • Schottky Field Emission Scanning Electron Microscope SU5000
        • Transmission Electron Microscope (TEM)
          • Field Emission Transmission Electron Microscope HF5000
          • Field Emission Transmission Electron Microscope HF-3300
          • Transmission Electron Microscope H-9500
          • Transmission Electron Microscope HT7800 Series
        • Transmission Electron Microscope (STEM)
          • Field Emission Scanning Transmission Electron Microscope HD-2700 with and without spherical aberration corrector
      • MicroCT
        • Specimen Systems
          • µCT 35
          • µCT 40
          • µCT 50 (nano CT)
          • µCT 80
          • µCT 100
        • Preclinical Systems
          • vivaCT 40 - In vivo MicroCT
          • vivaCT 75 - In vivo MicroCT
          • vivaCT 80 - In vivo MicroCT
          • XtremeCT
        • Clinical microCT
          • XtremeCT
      • Scanning Acoustic Microscopy
        • KSI v-Series
          • KSI v-350
          • KSI v-400
          • KSI v-700
          • KSI v-1000
          • KSI v-duo
          • KSI v-quattro
          • KSI v-octo
        • KSI i-Series
          • KSI Auto LED SAM
          • KSI i-Air
          • KSI i-Ingot
          • KSI i-Wafer
          • KSI i-XL
        • KSI nano-Series
          • KSI nano
    • Focused Ion Beam
      • Focused Ion and Electron Beam System Ethos NX5000
      • Real-time 3D analytical FIB-SEM NX9000
      • Focused Ion and Electron Beam System & Triple Beam System NX2000
      • Focused Ion Beam System MI4050
      • Mirco-sampling system
      • CAD Navigation System
        NASFA (Navigation
        system for Failure
        Analysis)
    • Atomic Force Microscopy
      • Probe Station AFM5000II / Real TuneII
      • General-purpose Small Unit AFM5100N
      • Environment Control Unit AFM5300E
      • Atomic Force Microscope AFM5500M
    • Microanalysis
      • Energy Dispersive Microanalysis System (EDS)
        • TEAM™ EDS System for SEM
        • TEAM™ EDS System for TEM
        • Genesis System
        • EDS Detectors
          • Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
          • Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
          • Si(Li) Detector
      • Wavelength Dispersive Microanalysis System (WDS)
        • LEXS
        • TEXS
      • Electron Backscattered Diffraction (EBSD)
        • TEAM™ EBSD Analysis System
        • OIM™ Data Analysis
        • EBSD Cameras
          • Hikari XP EBSD Camera
          • DigiView IV EBSD Camera
          • Forward Scatter Detector (FSD)
    • nano-IR Spectroscopy
      • mIRage IR microscope
      • O-PTIR
    • Surface Metrology
      • Measuring Microscopes
        • Portable Measuring Microscopes
        • Video Measuring Microscopes
        • Measuring Microscopes with eyepiece
      • Microhardness Tester VMHT
    • Surface Sciences
      • LEIS
      • Time OF Flight SIMS
        • TOF.SIMS5
        • TOF.SIMS 300
        • TOF.SIMS 300 R
        • Customised Systems
      • X-ray Photoelectron Spectrometer (XPS)
        • K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
        • ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
        • Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
    • Raman Spectroscopy
      • XploRA Series
        • XploRA ONE™ - Simply better Raman
        • XploRA™ PLUS
        • XploRA INV
        • XP Examina - Forensics Package
      • LabRAM HR Evolution
      • Triple Raman spectrometers
    • Sample Preparations
      • Sputter Coaters and SEM/ TEM Carbon Coaters
        • SC7620 Mini Sputter Coater/Glow Discharge System
        • Q150V Plus for ultra-fine coatings in high vacuum applications
        • Q150R Plus - Rotary Pumped Coater
        • Q150T Plus - Turbomolecular pumped coater
        • Q150 GB Turbo-Pumped Sputter Coater / Carbon Coater for Glove Box
        • Q300T T Plus - triple target sputter coater for specimens up to 200mm diameter
        • Q300T D Plus - dual target sequential sputtering for specimens up to 150 mm diameter
      • Cryo-SEM Preparation Systems
        • PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
        • PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
        • PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
      • Critical Point Dryers
        • E3100 Critical Point Dryer
        • K850 Critical Point Dryer
        • K850WM Large Chamber Critical Point Dryer
      • Freeze Dryers for Sample Preparation
        • K750X Peltier-Cooled EM Freeze Dryer
        • K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
      • Bench-Top Vacuum Evaporators
        • K975X/K975S Turbo-Pumped Thermal Evaporators
      • Recirculating Heaters and Chillers
        • E4800 Recirculating Heater/Chillers
      • Coolstage - Peltier-Cooled SEM Stage
      • K1050X RF Plasma Etcher/Asher/Cleaner
      • PP3004 QuickLok Ambient Transfer System
      • GloQube Glow Discharge System for TEM Grids and Surface Modifications
      • Sputter Targets
      • Carbon Consumables
      • IM4000Plus Series Ion-Milling Systems
      • ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
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Our Products
  • Advanced Microscopy
    • Electron Microscopy
      • TableTop Microscope
        • Tabletop Microscopes TM4000II/TM4000PlusII
        • Tabletop Microscopes TM4000/TM4000Plus
        • TM Series Energy Dispersive X-ray Spectrometer: Quantax75
        • TM Series Energy Dispersive X-ray Spectrometer: Element Series
        • TM Series Energy Dispersive X-Ray Spectrometers: AZtec Series
        • The TM Series 3D visualization software Hitachi map 3D
      • Variable Pressure Scanning Electron Microscope (VP-SEM)
        • Scanning Electron Microscopes SU3800/SU3900
        • Scanning Electron Microscope SU3500
        • Scanning Electron Microscope S-3700N
        • Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
      • Field Emission Scanning Electron Microscope (FESEM)
        • Ultra-high Resolution Field Emission Scanning Electron Microscope SU9000
        • Ultra-high Resolution Field Emission Scanning Electron Microscope Rugulus Series
        • Ultra-High-Resolution Schottky Field Emission Scanning Electron Microscope SU7000
        • Schottky Field Emission Scanning Electron Microscope SU5000
      • Transmission Electron Microscope (TEM)
        • Field Emission Transmission Electron Microscope HF5000
        • Field Emission Transmission Electron Microscope HF-3300
        • Transmission Electron Microscope H-9500
        • Transmission Electron Microscope HT7800 Series
      • Transmission Electron Microscope (STEM)
        • Field Emission Scanning Transmission Electron Microscope HD-2700 with and without spherical aberration corrector
    • MicroCT
      • Specimen Systems
        • µCT 35
        • µCT 40
        • µCT 50 (nano CT)
        • µCT 80
        • µCT 100
      • Preclinical Systems
        • vivaCT 40 - In vivo MicroCT
        • vivaCT 75 - In vivo MicroCT
        • vivaCT 80 - In vivo MicroCT
        • XtremeCT
      • Clinical microCT
        • XtremeCT
    • Scanning Acoustic Microscopy
      • KSI v-Series
        • KSI v-350
        • KSI v-400
        • KSI v-700
        • KSI v-1000
        • KSI v-duo
        • KSI v-quattro
        • KSI v-octo
      • KSI i-Series
        • KSI Auto LED SAM
        • KSI i-Air
        • KSI i-Ingot
        • KSI i-Wafer
        • KSI i-XL
      • KSI nano-Series
        • KSI nano
  • Focused Ion Beam
    • Focused Ion and Electron Beam System Ethos NX5000
    • Real-time 3D analytical FIB-SEM NX9000
    • Focused Ion and Electron Beam System & Triple Beam System NX2000
    • Focused Ion Beam System MI4050
    • Mirco-sampling system
    • CAD Navigation System
      NASFA (Navigation
      system for Failure
      Analysis)
  • Atomic Force Microscopy
    • Probe Station AFM5000II / Real TuneII
    • General-purpose Small Unit AFM5100N
    • Environment Control Unit AFM5300E
    • Atomic Force Microscope AFM5500M
  • Microanalysis
    • Energy Dispersive Microanalysis System (EDS)
      • TEAM™ EDS System for SEM
      • TEAM™ EDS System for TEM
      • Genesis System
      • EDS Detectors
        • Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
        • Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
        • Si(Li) Detector
    • Wavelength Dispersive Microanalysis System (WDS)
      • LEXS
      • TEXS
    • Electron Backscattered Diffraction (EBSD)
      • TEAM™ EBSD Analysis System
      • OIM™ Data Analysis
      • EBSD Cameras
        • Hikari XP EBSD Camera
        • DigiView IV EBSD Camera
        • Forward Scatter Detector (FSD)
  • nano-IR Spectroscopy
    • mIRage IR microscope
    • O-PTIR
  • Surface Metrology
    • Measuring Microscopes
      • Portable Measuring Microscopes
      • Video Measuring Microscopes
      • Measuring Microscopes with eyepiece
    • Microhardness Tester VMHT
  • Surface Sciences
    • LEIS
    • Time OF Flight SIMS
      • TOF.SIMS5
      • TOF.SIMS 300
      • TOF.SIMS 300 R
      • Customised Systems
    • X-ray Photoelectron Spectrometer (XPS)
      • K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
      • ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
      • Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
  • Raman Spectroscopy
    • XploRA Series
      • XploRA ONE™ - Simply better Raman
      • XploRA™ PLUS
      • XploRA INV
      • XP Examina - Forensics Package
    • LabRAM HR Evolution
    • Triple Raman spectrometers
  • Sample Preparations
    • Sputter Coaters and SEM/ TEM Carbon Coaters
      • SC7620 Mini Sputter Coater/Glow Discharge System
      • Q150V Plus for ultra-fine coatings in high vacuum applications
      • Q150R Plus - Rotary Pumped Coater
      • Q150T Plus - Turbomolecular pumped coater
      • Q150 GB Turbo-Pumped Sputter Coater / Carbon Coater for Glove Box
      • Q300T T Plus - triple target sputter coater for specimens up to 200mm diameter
      • Q300T D Plus - dual target sequential sputtering for specimens up to 150 mm diameter
    • Cryo-SEM Preparation Systems
      • PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
      • PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
      • PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
    • Critical Point Dryers
      • E3100 Critical Point Dryer
      • K850 Critical Point Dryer
      • K850WM Large Chamber Critical Point Dryer
    • Freeze Dryers for Sample Preparation
      • K750X Peltier-Cooled EM Freeze Dryer
      • K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
    • Bench-Top Vacuum Evaporators
      • K975X/K975S Turbo-Pumped Thermal Evaporators
    • Recirculating Heaters and Chillers
      • E4800 Recirculating Heater/Chillers
    • Coolstage - Peltier-Cooled SEM Stage
    • K1050X RF Plasma Etcher/Asher/Cleaner
    • PP3004 QuickLok Ambient Transfer System
    • GloQube Glow Discharge System for TEM Grids and Surface Modifications
    • Sputter Targets
    • Carbon Consumables
    • IM4000Plus Series Ion-Milling Systems
    • ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM

                                                
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