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    • Advanced Microscopy
      • Electron Microscopy
        • TableTop Microscope
          • Tabletop Microscopes TM4000II/TM4000PlusII
          • Tabletop Microscopes TM4000/TM4000Plus
          • TM Series Energy Dispersive X-ray Spectrometer: Quantax75
          • TM Series Energy Dispersive X-ray Spectrometer: Element Series
          • TM Series Energy Dispersive X-Ray Spectrometers: AZtec Series
          • The TM Series 3D visualization software Hitachi map 3D
        • Variable Pressure Scanning Electron Microscope (VP-SEM)
          • Scanning Electron Microscopes SU3800/SU3900
          • Scanning Electron Microscope SU3500
          • Scanning Electron Microscope S-3700N
          • Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
        • Field Emission Scanning Electron Microscope (FESEM)
          • Ultra-high Resolution Field Emission Scanning Electron Microscope SU9000
          • Ultra-high Resolution Field Emission Scanning Electron Microscope Rugulus Series
          • Ultra-High-Resolution Schottky Field Emission Scanning Electron Microscope SU7000
          • Schottky Field Emission Scanning Electron Microscope SU5000
        • Transmission Electron Microscope (TEM)
          • Field Emission Transmission Electron Microscope HF5000
          • Field Emission Transmission Electron Microscope HF-3300
          • Transmission Electron Microscope H-9500
          • Transmission Electron Microscope HT7800 Series
        • Transmission Electron Microscope (STEM)
          • Field Emission Scanning Transmission Electron Microscope HD-2700 with and without spherical aberration corrector
      • MicroCT
        • Specimen Systems
          • µCT 35
          • µCT 40
          • µCT 45
          • µCT 50 (nano CT)
          • µCT 90
          • µCT 100
          • µCT 100 HE
        • Preclinical Systems
          • vivaCT 40 - In vivo MicroCT
          • vivaCT 75 - In vivo MicroCT
          • vivaCT 80 - In vivo MicroCT
          • XtremeCT II
          • XtremeCT
        • Clinical microCT
          • XtremeCT II
      • Scanning Acoustic Microscopy
        • KSI v-Series
          • KSI v 300
          • KSI v8
          • KSI v8 Advanced
          • KSI v8 Duo
          • KSI v8 Multihead
    • Focused Ion Beam
      • Focused Ion and Electron Beam System Ethos NX5000
      • Real-time 3D analytical FIB-SEM NX9000
      • Focused Ion and Electron Beam System & Triple Beam System NX2000
      • Focused Ion Beam System MI4050
      • Mirco-sampling system
      • CAD Navigation System
        NASFA (Navigation
        system for Failure
        Analysis)
    • Atomic Force Microscopy
      • Probe Station AFM5000II / Real TuneII
      • General-purpose Small Unit AFM5100N
      • Environment Control Unit AFM5300E
      • Atomic Force Microscope AFM5500M
    • Microanalysis
      • Energy Dispersive Microanalysis System (EDS)
        • TEAM™ EDS System for SEM
        • TEAM™ EDS System for TEM
        • Genesis System
        • EDS Detectors
          • Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
          • Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
          • Si(Li) Detector
      • Wavelength Dispersive Microanalysis System (WDS)
        • LEXS
        • TEXS
      • Electron Backscattered Diffraction (EBSD)
        • TEAM™ EBSD Analysis System
        • OIM™ Data Analysis
        • EBSD Cameras
          • Hikari XP EBSD Camera
          • DigiView IV EBSD Camera
          • Forward Scatter Detector (FSD)
    • nano-IR Spectroscopy
      • mIRage IR microscope
      • O-PTIR
    • Surface Metrology
      • Measuring Microscopes
        • Portable Measuring Microscopes
        • Video Measuring Microscopes
        • Measuring Microscopes with eyepiece
      • Microhardness Tester VMHT
    • Surface Sciences
      • LEIS
      • VLS-80
      • SurfaceLab 7
      • SIMS
        • M6
        • M6 Plus
        • M6 Hybrid SIMS
        • TOF-SIMS 5
      • X-ray Photoelectron Spectrometer (XPS)
        • K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
        • ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
        • Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
    • Raman Spectroscopy
      • XploRA Series
        • XploRA ONE™ - Simply better Raman
        • XploRA™ PLUS
        • XploRA INV
        • XP Examina - Forensics Package
      • LabRAM HR Evolution
      • Triple Raman spectrometers
    • Sample Preparations
      • Ultramicrotomes
        • PowerTome 3D
        • PowerTome PCZ
        • PowerTome XL
        • PowerTome FL
        • LN Ultra
        • Advanced Substrate Holder
        • Automated Tape Collecting Ultramicrotome
      • Rotary Microtomes
        • MT990: Rotary Microtome
        • MT990 with CR1000: Rotary Microtome with Cryosectioning System
        • MR3: Series 300 Motorized Rotary Microtome
        • MR2: Series 200 Manual Rotary Microtome
      • Workflow Instruments
        • Automated EM Tissue Processor
        • Anti-Vibration Table
        • FS8500: Freeze Substitution System
        • GKM2: Glass Knife Maker
      • Sputter Coaters and SEM/ TEM Carbon Coaters
        • SC7620 Mini Sputter Coater/Glow Discharge System
        • Q150V Plus for ultra-fine coatings in high vacuum applications
        • Q150R Plus - Rotary Pumped Coater
        • Q150T Plus - Turbomolecular pumped coater
        • Q150 GB Turbo-Pumped Sputter Coater / Carbon Coater for Glove Box
        • Q300T T Plus - triple target sputter coater for specimens up to 200mm diameter
        • Q300T D Plus - dual target sequential sputtering for specimens up to 150 mm diameter
      • Cryo-SEM Preparation Systems
        • PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
        • PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
        • PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
      • Critical Point Dryers
        • E3100 Critical Point Dryer
        • K850 Critical Point Dryer
        • K850WM Large Chamber Critical Point Dryer
      • Freeze Dryers for Sample Preparation
        • K750X Peltier-Cooled EM Freeze Dryer
        • K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
      • Bench-Top Vacuum Evaporators
        • K975X/K975S Turbo-Pumped Thermal Evaporators
      • Recirculating Heaters and Chillers
        • E4800 Recirculating Heater/Chillers
      • Coolstage - Peltier-Cooled SEM Stage
      • K1050X RF Plasma Etcher/Asher/Cleaner
      • PP3004 QuickLok Ambient Transfer System
      • GloQube Glow Discharge System for TEM Grids and Surface Modifications
      • Sputter Targets
      • Carbon Consumables
      • IM4000Plus Series Ion-Milling Systems
      • ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
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Measuring Microscopes

Portable Measuring Microscopes

Our rugged Portable Measuring Microscopes have a high quality and are the perfect companion. They can be equipped with a battery lamp and an optional video camera. A large variety of eyepieces and objective is available. Transport boxes or a plastic object protection ring are examples of the accessories.

Rod Microscope SM

The Rod Microscope SM is a multifunctional testing instrument for applications where magnifying-glasses are not suitable any more.

It is put directly on the specimen to be measured / inspected.
Several configurations are available:

• with light transmissive base stand

• with battery lighting in the aluminium base stand

• with battery lighting and small base stand to measure hardness indentations

 

Magnifications   Fields of view    Measurement
   range
    Resolution
     25x to 100x
    9 mm to
    1,7  mm
 -   0,05 mm to
  0,0025 mm


Measuring Microscope MS1

Valuable, portable measuring microscope with integrated coaxial and angular incident illumination.

• steady, anodized aluminium body

• focussing by knurled ring and fine-pitch thread

• transformer with LED or battery LED lamp

Magnifications Fields of view Measurement
range
Resolution
20x to 800x
8,9 mm to
0,35 mm
Z 8 mm 0,05 mm to
0,0025 mm

Options:

• digital screw micrometre eyepiece for precise distance measurement
(1 µm resolution)

• digital z-measurement device for depth measurement, integrated in the body (1 µm resolution)

• high resolution digital USB video camera VM4-USB

• measuring software VMS-USB


Measuring Microscope TM2

The portable measuring microscope TM2 is used to measure structues on rollers and flat or cylindric products with 3 digital axes (X/Y/Z) - self contained with integrated batteries.

• solid v-block base for stable attachment

• rubber coated surface protects the product against scratches and damage

• eyepiece with diopter compensation and crosshair with concentric circles

• coaxial coarse / fine movement for focussing

Magnifications Fields of view Measurement
range
Resolution
     75x to 200x
 2,6 mm to 0,35 mm
       X/Y 25 mm
          Z 12 mm
        1 µm

 







   


















 















 































Measuring Microscopes

• Portable Measuring   Microscopes

• Video Measuring   Microscopes

• Measuring Microscopes   with eyepiece

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