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Advanced Microscopy
Electron Microscopy
TableTop Microscope
Tabletop Microscopes TM4000II/TM4000PlusII
Tabletop Microscopes TM4000/TM4000Plus
TM Series Energy Dispersive X-ray Spectrometer: Quantax75
TM Series Energy Dispersive X-ray Spectrometer: Element Series
TM Series Energy Dispersive X-Ray Spectrometers: AZtec Series
The TM Series 3D visualization software Hitachi map 3D
Variable Pressure Scanning Electron Microscope (VP-SEM)
Scanning Electron Microscopes SU3800/SU3900
Scanning Electron Microscope SU3500
Scanning Electron Microscope S-3700N
Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
Field Emission Scanning Electron Microscope (FESEM)
Ultra-high Resolution Field Emission Scanning Electron Microscope SU9000
Ultra-high Resolution Field Emission Scanning Electron Microscope Rugulus Series
Ultra-High-Resolution Schottky Field Emission Scanning Electron Microscope SU7000
Schottky Field Emission Scanning Electron Microscope SU5000
Transmission Electron Microscope (TEM)
Field Emission Transmission Electron Microscope HF5000
Field Emission Transmission Electron Microscope HF-3300
Transmission Electron Microscope H-9500
Transmission Electron Microscope HT7800 Series
Transmission Electron Microscope (STEM)
Field Emission Scanning Transmission Electron Microscope HD-2700 with and without spherical aberration corrector
MicroCT
Specimen Systems
µCT 35
µCT 40
µCT 45
µCT 50 (nano CT)
µCT 90
µCT 100
µCT 100 HE
Preclinical Systems
vivaCT 40 - In vivo MicroCT
vivaCT 75 - In vivo MicroCT
vivaCT 80 - In vivo MicroCT
XtremeCT II
XtremeCT
Clinical microCT
XtremeCT II
Scanning Acoustic Microscopy
KSI v-Series
KSI v 300
KSI v8
KSI v8 Advanced
KSI v8 Duo
KSI v8 Multihead
Focused Ion Beam
Focused Ion and Electron Beam System Ethos NX5000
Real-time 3D analytical FIB-SEM NX9000
Focused Ion and Electron Beam System & Triple Beam System NX2000
Focused Ion Beam System MI4050
Mirco-sampling system
CAD Navigation System
NASFA (Navigation
system for Failure
Analysis)
Atomic Force Microscopy
Probe Station AFM5000II / Real TuneII
General-purpose Small Unit AFM5100N
Environment Control Unit AFM5300E
Atomic Force Microscope AFM5500M
Microanalysis
Energy Dispersive Microanalysis System (EDS)
TEAM™ EDS System for SEM
TEAM™ EDS System for TEM
Genesis System
EDS Detectors
Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
Si(Li) Detector
Wavelength Dispersive Microanalysis System (WDS)
LEXS
TEXS
Electron Backscattered Diffraction (EBSD)
TEAM™ EBSD Analysis System
OIM™ Data Analysis
EBSD Cameras
Hikari XP EBSD Camera
DigiView IV EBSD Camera
Forward Scatter Detector (FSD)
nano-IR Spectroscopy
mIRage IR microscope
O-PTIR
Surface Metrology
Measuring Microscopes
Portable Measuring Microscopes
Video Measuring Microscopes
Measuring Microscopes with eyepiece
Microhardness Tester VMHT
Surface Sciences
LEIS
VLS-80
SurfaceLab 7
SIMS
M6
M6 Plus
M6 Hybrid SIMS
TOF-SIMS 5
X-ray Photoelectron Spectrometer (XPS)
K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
Raman Spectroscopy
XploRA Series
XploRA ONE™ - Simply better Raman
XploRA™ PLUS
XploRA INV
XP Examina - Forensics Package
LabRAM HR Evolution
Triple Raman spectrometers
Sample Preparations
Ultramicrotomes
PowerTome 3D
PowerTome PCZ
PowerTome XL
PowerTome FL
LN Ultra
Advanced Substrate Holder
Automated Tape Collecting Ultramicrotome
Rotary Microtomes
MT990: Rotary Microtome
MT990 with CR1000: Rotary Microtome with Cryosectioning System
MR3: Series 300 Motorized Rotary Microtome
MR2: Series 200 Manual Rotary Microtome
Workflow Instruments
Automated EM Tissue Processor
Anti-Vibration Table
FS8500: Freeze Substitution System
GKM2: Glass Knife Maker
Cryo-SEM Preparation Systems
PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
Critical Point Dryers
E3100 Critical Point Dryer
K850 Critical Point Dryer
K850WM Large Chamber Critical Point Dryer
Freeze Dryers for Sample Preparation
K750X Peltier-Cooled EM Freeze Dryer
K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
Bench-Top Vacuum Evaporators
K975X/K975S Turbo-Pumped Thermal Evaporators
Recirculating Heaters and Chillers
E4800 Recirculating Heater/Chillers
Coolstage - Peltier-Cooled SEM Stage
K1050X RF Plasma Etcher/Asher/Cleaner
PP3004 QuickLok Ambient Transfer System
GloQube Glow Discharge System for TEM Grids and Surface Modifications
Sputter Targets
Carbon Consumables
IM4000Plus Series Ion-Milling Systems
ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
Activities
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