logo

 
  • Home
  • Laboratory
  • Products ▼
    • Advanced Microscopy
      • Electron Microscopy
        • TableTop Microscope
          • Tabletop Microscopes TM4000II/TM4000PlusII
          • Tabletop Microscopes TM4000/TM4000Plus
          • TM Series Energy Dispersive X-ray Spectrometer: Quantax75
          • TM Series Energy Dispersive X-ray Spectrometer: Element Series
          • TM Series Energy Dispersive X-Ray Spectrometers: AZtec Series
          • The TM Series 3D visualization software Hitachi map 3D
        • Variable Pressure Scanning Electron Microscope (VP-SEM)
          • Scanning Electron Microscopes SU3800/SU3900
          • Scanning Electron Microscope SU3500
          • Scanning Electron Microscope S-3700N
          • Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
        • Field Emission Scanning Electron Microscope (FESEM)
          • Ultra-high Resolution Field Emission Scanning Electron Microscope SU9000
          • Ultra-high Resolution Field Emission Scanning Electron Microscope Rugulus Series
          • Ultra-High-Resolution Schottky Field Emission Scanning Electron Microscope SU7000
          • Schottky Field Emission Scanning Electron Microscope SU5000
        • Transmission Electron Microscope (TEM)
          • Field Emission Transmission Electron Microscope HF5000
          • Field Emission Transmission Electron Microscope HF-3300
          • Transmission Electron Microscope H-9500
          • Transmission Electron Microscope HT7800 Series
        • Transmission Electron Microscope (STEM)
          • Field Emission Scanning Transmission Electron Microscope HD-2700 with and without spherical aberration corrector
      • MicroCT
        • Specimen Systems
          • µCT 35
          • µCT 40
          • µCT 45
          • µCT 50 (nano CT)
          • µCT 90
          • µCT 100
          • µCT 100 HE
        • Preclinical Systems
          • vivaCT 40 - In vivo MicroCT
          • vivaCT 75 - In vivo MicroCT
          • vivaCT 80 - In vivo MicroCT
          • XtremeCT II
          • XtremeCT
        • Clinical microCT
          • XtremeCT II
      • Scanning Acoustic Microscopy
        • KSI v-Series
          • KSI v 300
          • KSI v8
          • KSI v8 Advanced
          • KSI v8 Duo
          • KSI v8 Multihead
    • Focused Ion Beam
      • Focused Ion and Electron Beam System Ethos NX5000
      • Real-time 3D analytical FIB-SEM NX9000
      • Focused Ion and Electron Beam System & Triple Beam System NX2000
      • Focused Ion Beam System MI4050
      • Mirco-sampling system
      • CAD Navigation System
        NASFA (Navigation
        system for Failure
        Analysis)
    • Atomic Force Microscopy
      • Probe Station AFM5000II / Real TuneII
      • General-purpose Small Unit AFM5100N
      • Environment Control Unit AFM5300E
      • Atomic Force Microscope AFM5500M
    • Microanalysis
      • Energy Dispersive Microanalysis System (EDS)
        • TEAM™ EDS System for SEM
        • TEAM™ EDS System for TEM
        • Genesis System
        • EDS Detectors
          • Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
          • Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
          • Si(Li) Detector
      • Wavelength Dispersive Microanalysis System (WDS)
        • LEXS
        • TEXS
      • Electron Backscattered Diffraction (EBSD)
        • TEAM™ EBSD Analysis System
        • OIM™ Data Analysis
        • EBSD Cameras
          • Hikari XP EBSD Camera
          • DigiView IV EBSD Camera
          • Forward Scatter Detector (FSD)
    • nano-IR Spectroscopy
      • mIRage IR microscope
      • O-PTIR
    • Surface Metrology
      • Measuring Microscopes
        • Portable Measuring Microscopes
        • Video Measuring Microscopes
        • Measuring Microscopes with eyepiece
      • Microhardness Tester VMHT
    • Surface Sciences
      • LEIS
      • VLS-80
      • SurfaceLab 7
      • SIMS
        • M6
        • M6 Plus
        • M6 Hybrid SIMS
        • TOF-SIMS 5
      • X-ray Photoelectron Spectrometer (XPS)
        • K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
        • ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
        • Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
    • Raman Spectroscopy
      • XploRA Series
        • XploRA ONE™ - Simply better Raman
        • XploRA™ PLUS
        • XploRA INV
        • XP Examina - Forensics Package
      • LabRAM HR Evolution
      • Triple Raman spectrometers
    • Sample Preparations
      • Ultramicrotomes
        • PowerTome 3D
        • PowerTome PCZ
        • PowerTome XL
        • PowerTome FL
        • LN Ultra
        • Advanced Substrate Holder
        • Automated Tape Collecting Ultramicrotome
      • Rotary Microtomes
        • MT990: Rotary Microtome
        • MT990 with CR1000: Rotary Microtome with Cryosectioning System
        • MR3: Series 300 Motorized Rotary Microtome
        • MR2: Series 200 Manual Rotary Microtome
      • Workflow Instruments
        • Automated EM Tissue Processor
        • Anti-Vibration Table
        • FS8500: Freeze Substitution System
        • GKM2: Glass Knife Maker
      • Sputter Coaters and SEM/ TEM Carbon Coaters
        • SC7620 Mini Sputter Coater/Glow Discharge System
        • Q150V Plus for ultra-fine coatings in high vacuum applications
        • Q150R Plus - Rotary Pumped Coater
        • Q150T Plus - Turbomolecular pumped coater
        • Q150 GB Turbo-Pumped Sputter Coater / Carbon Coater for Glove Box
        • Q300T T Plus - triple target sputter coater for specimens up to 200mm diameter
        • Q300T D Plus - dual target sequential sputtering for specimens up to 150 mm diameter
      • Cryo-SEM Preparation Systems
        • PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
        • PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
        • PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
      • Critical Point Dryers
        • E3100 Critical Point Dryer
        • K850 Critical Point Dryer
        • K850WM Large Chamber Critical Point Dryer
      • Freeze Dryers for Sample Preparation
        • K750X Peltier-Cooled EM Freeze Dryer
        • K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
      • Bench-Top Vacuum Evaporators
        • K975X/K975S Turbo-Pumped Thermal Evaporators
      • Recirculating Heaters and Chillers
        • E4800 Recirculating Heater/Chillers
      • Coolstage - Peltier-Cooled SEM Stage
      • K1050X RF Plasma Etcher/Asher/Cleaner
      • PP3004 QuickLok Ambient Transfer System
      • GloQube Glow Discharge System for TEM Grids and Surface Modifications
      • Sputter Targets
      • Carbon Consumables
      • IM4000Plus Series Ion-Milling Systems
      • ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
  • Activities
  • About us
  • Career
  • Contact us
Sample Preparations

PP3004 QuickLok Ambient Temperature Airlock

The QuickLok provides a rapid way of transferring ambient temperature specimens into SEM, FIB/SEM or other suitable vacuum systems. A key feature of the QuickLok is the ability to vacuum transfer specimens that are sensitive to normal environmental conditions. The transfer device uses a sealed vacuum chamber which can be interfaced to a glove box for inert gas transfer or can allow transfer to and from a range of vacuum platforms.

Key features

• Rapid specimen exchange
• Inert gas transfer from glove box
• Vacuum transfer into SEM or FIB/SEM from other vacuum platforms
• Upgrade path to CoolLok
• Extended warranty option

The QuickLok provides a rapid way of transferring ambient temperature specimens into SEM, FIB/SEM or other suitable vacuum systems. A key feature of the QuickLok is the ability to vacuum transfer specimens that are sensitive to normal environmental conditions. The transfer device uses a sealed vacuum chamber which can be interfaced to a glove box for inert gas transfer or allow transfer to and from other range of vacuum platforms.

Product description

Cooling dewar, trolley and controller

The cold stage and cold trap are cooled by a floor-mounted, vacuum isolated 21 litre dewar and heat exchanger assembly which at normal operating temperatures can run for up to 24 hours between fills. The gas lines between the dewar and the SEM interface are vacuum isolated for maximum thermal efficiency.

The cooling dewar is located on a floor-mounted trolley which also houses the temperature and gas control system.

System components

Mounted onto a suitable vacuum chamber port, the QuickLok consists of a loading chamber body with integrated controls for pumping, venting and transfer. A custom-designed interface flange and connections to the pumping system are included (see: Pumping below).

The compact vacuum transfer device has a bayonet fitting to a dovetail-profile specimen holder (shuttle). Standard shuttles are included, but optional holders allow a variety of specimen types to be handled.

Inside the SEM there is fitted a stage to accept the specimen shuttle. To aid specimen exchange an interlocked LED chamber light is mounted to the inside of the QuickLok interface.

Using the QuickLok

The specimen is mounted on a suitable holder and the transfer device fitted onto the vacuum airlock. The airlock and transfer device are then evacuated to a preset vacuum, the gate valve opened and the specimen guided onto the SEM stage.

For transfers from other vacuum systems, or a glove box, additional interface flanges are available on request.

25852 glove box valve/airlock interface

An optional glove box valve/airlock assembly (25852) can be supplied. The airlock is connected to a glove box using a generic NW fitting and for most applications requires a suitable pumping system (13034 rotary pump or 2336 turbo plus diaphragm pump system). Gas connections are included. The outer face of the 25852 is designed to accept the vacuum transfer device.

Pumping

The QuickLok requires either a rotary pump or oil-free vacuum turbomolecular pumping station.

 

PP3004 QuickLok Ambient Temperature Airlock

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Sample Preparations

• PP3004 QuickLok   Ambient Temperature   Airlock

Copyright 2012 © All Rights Reserved By HI-TECH INSTRUMENTS.