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Energy Dispersive Microanalysis System

Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)

Apollo XL SDD Apollo X SDD

The Apollo X SDD utilizes the latest SDD technology to provide a superior EDS detector, capable of handling high count rates with excellent peak positioning and resolution stability.

Apollo X SDD

The Apollo X SDD utilizes the latest SDD technology to provide a superior EDS detector, capable of handling high count rates with excellent peak positioning and resolution stability.

Apollo X SDD features include:

• Exceptional and stable performance over a wide range of input count   rates
• Standard Apollo X has a guaranteed resolution of 131eV or better,   measured at MnK up to 100,000 cps
• Premium Apollo X has a guaranteed resolution of 129eV or better,   measured at MnK up to 100,000 cps
• Premium Plus Apollo X has a guaranteed resolution of 127eV or better,   measured at MnK up to 100,000 cps
• Typical resolution for Premium Plus Apollo is < 125eV or better for   Manganese
• Superior qualitative and quantitative analysis
• Full X-ray map collection in seconds
• Superior light element performance down to (and including) Beryllium
• Superior low energy performance with resolutions typically ranging from <   52eV to <60eV for Carbon
• Excellent and stable energy resolution to over 200Kcps
• Peak position stability over the dynamic range of the detector
• Electronics capable of handling up to 850,000 input cps and throughput   of over 350,000 cps
• Examples of Apollo X SDD Performance
• The Apollo X SDD is the latest member of EDAX's Apollo series providing   additional solutions for the X-ray microanalysis market by offering superior   energy resolution and light element performance.
• One of the important features of the SDD is the ability to operate at high   count rates while still providing good energy resolution. The above X-rap   map of a Cu Ore collected in just three minutes shows this capability,   with the Apollo X operating at input count rates of 100Kcps

Apollo XL SDD

The Apollo XL large area SDD technology offers superior collection efficiency, light element performance, excellent resolution, and peak positioning stability

Apollo XL SDD features include:

• Collection efficiency over 3 times that of the best designed 10mm2 (SiLi),   enabling the collection of high count rates
• Superior light element performance down to (and including) Boron
• Excellent and stable energy resolution to over 200Kcps
• Peak position stability over the dynamic range of the detector
• Superior qualitative and quantitative analysis
• Full X-ray map collection in seconds
• Electronics capable of handling count rates of over 850,000 cps



 

Apollo XL SDD Apollo X SDD

Energy Dispersive Microanalysis System (EDS)

• TEAM™ EDS System for   SEM

• TEAM™ EDS System for   TEM

• Genesis System

• EDS Detectors
  - Silicon Drift Detector
    (SDD) for the
    Transmission Electron
    Microscope (TEM)
  
- Silicon Drift Detector
    (SDD) for the Scanning
    Electron Microscope
    (SEM)
  
- Si(Li) Detector

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